MTEX 3.5.0

Quantitative texture analysis software
MTEX aims to simplify your work with crystallographic geometries especially when it comes to symmetries, 4 Euler angle conventions and crystallographic information files (CIF).

MTEX also provides you tools for pole figure analysis ( 20 data formats, data correction, ODF calculation, automatic ghost correction, zero range method, pole figure simulation), EBSD data analysis (5 data formats, data correction, grain reconstruction, ODF calculation, grain boundary analysis, miss orientation analysis, EBSD simulation, ODF analysis (model ODFs (uniform, unimodal, fibre, Bingham, Fourier) and much more.

MTEX is cross-platform and it works on Windows, Mac OSX and Linux.

Detailed instructions on how to install and use the MTEX utility on your Mac are available HERE.

Main features:

  • Analyze and visualize crystallographic geometries
  • Calculate with model ODFs
  • Import, analyze and visualize diffraction data
  • Recover orientation density functions (ODFs)
  • Calculate texture characteristics
  • Create publication ready plots
  • Writing scripts to process many data sets

last updated on:
January 11th, 2014, 4:04 GMT
file size:
49.1 MB
license type:
developed by:
Ralf Hielscher
operating system(s):
Mac OS X
binary format:
Universal Binary
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What's New in This Release:
  • Misorientation Colorcoding:
  • Patala colormaps for misorientations
  • publication: S. Patala, J. K. Mason, and C. A. Schuh, Improved representations of misorientation information for grain boundary science and engineering, Prog. Mater. Sci., vol. 57, no. 8, pp. 1383-1425, 2012.
  • implementation: Oliver Johnson
read full changelog

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